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Temperature Dependent Current-voltage Measurements Of Neutron Irradiated Al0.27ga0.73n/gan Modulation Doped Field Effect Transistors
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Temperature Dependent Current-voltage Measurements Of Neutron Irradiated Al0.27ga0.73n/gan Modulation Doped Field Effect Transistors
From Troy A Uhlman
Current price: $60.51
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Coles
Temperature Dependent Current-voltage Measurements Of Neutron Irradiated Al0.27ga0.73n/gan Modulation Doped Field Effect Transistors
From Troy A Uhlman
Current price: $60.51
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Size: 0.41 x 9.69 x 0.78
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In this research, the first ever neutron irradiation study of AlGaN/GaN MODFETs was conducted. Devices irradiated to a total 1 MeV Eq (Si) neutron fluence of 1.2x10 16 n/cm2 demonstrated the temperature dependence of irradiation and annealing. Devices irradiated at 80 K exhibited significant persistent electrical degradation at only 5.4 rad (Si), whereas those irradiated at elevated temperatures exhibit transient increases in gate and drain current up to 400 krad (Si). I-V measurements indicate substantial radiation-induced increased gate and drain currents occur only at low-temperature irradiations. The introduction of a high-density of donor defects is hypothesized as the primary cause of both increased values. Irradiating at temperatures gt; 300 K effectively reduces total accumulated dose effects even at 400 krad(Si). | Temperature Dependent Current-voltage Measurements Of Neutron Irradiated Al0.27ga0.73n/gan Modulation Doped Field Effect Transistors