Compare Scaling Effects on Metal-oxide-semiconductor Device Characteristics by Steven Walstra, Hardcover | Indigo Chapters

Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, \"Scaling Effects on Metal-oxide-semiconductor Device Characteristics\" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation. | Scaling Effects on Metal-oxide-semiconductor Device Characteristics by Steven Walstra, Hardcover | Indigo Chapters